Lavoisier S.A.S.
14 rue de Provigny
94236 Cachan cedex
FRANCE

Heures d'ouverture 08h30-12h30/13h30-17h30
Tél.: +33 (0)1 47 40 67 00
Fax: +33 (0)1 47 40 67 02


Url canonique : www.lavoisier.fr/livre/autre/the-boundary-scan-handbook-4th-ed/parker/descriptif_2768711
Url courte ou permalien : www.lavoisier.fr/livre/notice.asp?ouvrage=2768711

The Boundary-Scan Handbook (4th Ed., 4th ed. 2016)

Langue : Anglais

Auteur :

Couverture de l’ouvrage The Boundary-Scan Handbook
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;
 
Explains the new IEEE 1149.8.1 subsidiary standard and applications;
 
Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1                  Digital Boundary-Scan
IEEE Std 1149.4                  Analog Boundary-Scan
IEEE Std 1149.6                  Advanced I/O Testing
IEEE Std 1149.8.1                Passive Component Testing
IEEE Std 1149.1-2013             The 2013 Revision of 114
9.1
IEEE Std 1532                    In-System Configuration
IEEE Std 1149.6-2015             The 2015 Revision of 1149.6

Boundary-Scan Basics And Vocabulary.-  Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Topics.- Design for Boundary-Scan Test.- Analog Measurement Basics.- IEEE 1149.4 Analog Boundary-Scan.-  IEEE 1149.6 Testing Advanced I/O.-  IEEE 1532:In-System Configuration.- IEEE 1149.8.1: Passive Components.- IEEE 1149.1:The 2013 Revision.-  IEEE 1149.6: The 2015 Revision.
Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.
Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers Explains the new IEEE 1149.8.1 subsidiary standard and applications Describes the latest updates on the supplementary IEEE testing standards

Date de parution :

Ouvrage de 552 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

Prix indicatif 126,59 €

Ajouter au panier

Date de parution :

Ouvrage de 552 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

189,89 €

Ajouter au panier